NFR Polaris S160 Product Overview
High resolution 2D/3D Imaging for Non-destructive inspection applications
- Non-invasive, visualization at micron level with sub-micron feature recognition
- Easy-to-use X-Ray Inspection System
- Anti-collision design for damage-free inspection
- Detail detectability down to < 1um
- Highest magnification of up to 100x (geometric)
- Slip-ring technology for continuous rotation
- The sample can be manipulated with 6 axes of freedom
- NanoFocusRay Co., Ltd. Offers NFR Polaris-S series of sub-micro CT scanners dedicated for high resolution imaging
